The Tagged-Item Performance Protocol (TIPP) comprises three parts:
- Tagged-Item Grading: Grade Definitions Guideline
- Provides the specific definitions for RFID performance grades
- Latest version: https://ref.gs1.org/guidelines/tipp/grading-definitions/
- Current version: (1.2.0) https://ref.gs1.org/guidelines/tipp/grading-definitions/1.2.0
- Archive: https://ref.gs1.org/guidelines/tipp/grading-definitions/archive
- Tagged-Item Grading: Test Configuration Guideline
- Provides the placement for tagged-item when the item is measured using the Tagged-Item Test Methodology
- Latest version: https://ref.gs1.org/guidelines/tipp/test-configuration/
- Current version: (1.2.0) https://ref.gs1.org/guidelines/tipp/test-configuration/1.2.0
- Archive: https://ref.gs1.org/guidelines/tipp/test-configuration/archive
- Tagged-Item Grading: Testing Methodology Guideline
- Provides the testing procedures for tagged-item grading
- Latest version: https://ref.gs1.org/guidelines/tipp/testing-methodology/
- Current version: (1.2.0) https://ref.gs1.org/guidelines/tipp/testing-methodology/1.2.0
- Archive: https://ref.gs1.org/guidelines/tipp/testing-methodology/archive